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An L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopy File

Lee, Eunjoo , Kim, Minseo , Seong, Jungwoo , Shin, Heungjoo , Lim, Geunbae

Article Issue Date2013-06 View196
Bitmap-assisted focused ion beam fabrication of combined atomic force scanning electrochemical Microscopy probes

Moon, Jong-Seok , Shin, Heungjoo , Mizaikoff, Boris , Kranz, Christine

Article Issue Date2007-09 View106
Development of wafer-level batch fabrication for combined atomic force-scanning electrochemical microscopy (AFM-SECM) probes File

Shin, Heungjoo , Hesketh, P. J. , Mizaikofff, B. , Kranz, C.

Article Issue Date2008-09 View123
Microresonator mass sensors for detection of Bacillus anthracis Sterne spores in air and water File

Davila, Angelica P. , Jang, Jaesung , Gupta, Amit K. , Walter, Tom , Aronson, Arthur , Bashir, Rashid

Article Issue Date2007-06 View96
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