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Growth behavior and microstructure of Ge self-assembled islands on nanometer-scale patterned Si substrate File

Yoon, Tae-Sik , Zhao, ZM , Feng, W , Li, BY , Liu, J , Xie, YH , Ryu, DY , Russell, TP , Kim, HM , Kim, KB

Article Issue Date2006-05 View73
Initial stage of InAs growth on Si(001) studied by high-resolution transmission electron microscopy File

Zhao, ZM , Hulko, O , Yoon, Tae-Sik , Xie, YH

Article Issue Date2005-12 View93
Surface roughness and dislocation distribution in compositionally graded relaxed SiGe buffer layer with inserted-strained Si layers File

Yoon, Tae-Sik , Liu, J , Noori, AM , Goorsky, MS , Xie, YH

Article Issue Date2005-07 View101
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