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Characterization of the Goubau line for testing beam diagnostic instruments File

Kim, S. Y. , Stulle, F. , Sung, C. K. , Yoo, K. H. , Seok, J. , Moon, K. J. , Choi, C. U. , Chung, Y. , Kim, G. , Woo, H. J. , et al

Article Issue Date2017-12 View125
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