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Issue Date	Title	Author(s)	Type	View
2005-12	Quantum well behavior of single stacking fault 3C inclusions in 4H-SiC p-i-n diodes studied by ballistic electron emission microscopy	Park, Kibog; Pelz, JP; Grim, J; Skowronski, M	ARTICLE	828
2010-03-15	Strong hot electron reflection from subsurface 8H-SiC inclusion in 4H-SiC: Ballistic Electron Emission Microscopy (BEEM) study	Park, Kibog; Cai, W; Pelz, JP; Miao, MS; Lambrecht, WRL; Zhang, X; Skowronski, M; Capano, MA	CONFERENCE	93

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