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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)TypeView
2005-12Quantum well behavior of single stacking fault 3C inclusions in 4H-SiC p-i-n diodes studied by ballistic electron emission microscopyPark, Kibog; Pelz, JP; Grim, J; Skowronski, MARTICLE733
2010-03-15Strong hot electron reflection from subsurface 8H-SiC inclusion in 4H-SiC: Ballistic Electron Emission Microscopy (BEEM) studyPark, Kibog; Cai, W; Pelz, JP; Miao, MS; Lambrecht, WRL; Zhang, X; Skowronski, M; Capano, MACONFERENCE50
Showing results 1 to 2 of 2

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