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Showing results 1 to 3 of 3

Issue DateTitleAuthor(s)TypeView
2009-10Nanometer-resolution measurement and modeling of lateral variations of the effective work function at the bilayer Pt/Al/SiO2 interfaceCai, W.; Park, Kibog; Pelz, J.P.ARTICLE687
2005-09Nanoscale characterization of metal/semiconductor nanocontactsTivarus, C.; Park, Kibog; Hudait, M.K.; Ringel, S.A.; Pelz, J.P.ARTICLE648
2005-03-15Nanoscale characterization of metal/semiconductor nanocontactsTivarus, C; Park, Kibog; Hudait, M.K.; Ringel, S.A.; Pelz, J.P.CONFERENCE40
Showing results 1 to 3 of 3

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