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Nanometer-resolution measurement and modeling of lateral variations of the effective work function at the bilayer Pt/Al/SiO2 interface File

Cai, W. , Park, Kibog , Pelz, J.P.

Article Issue Date2009-10 View90
Nanoscale characterization of metal/semiconductor nanocontacts File

Tivarus, C. , Park, Kibog , Hudait, M.K. , Ringel, S.A. , Pelz, J.P.

Article Issue Date2005-09 View91
Nanoscale characterization of metal/semiconductor nanocontacts File

Tivarus, C , Park, Kibog , Hudait, M.K. , Ringel, S.A. , Pelz, J.P.

Conference Paper Issue Date2005-03-15 View66
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