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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)TypeView
2015-06-16Atomic-scale Research on 2D Materials using Aberration-corrected TEM (invited talk)Lee, Zonghoon; Ryu, Gyeong Hee; Park, Hyo ju; Kim, Jung Hwa; Kim, Na Yeon; Hong, Hyo-KiCONFERENCE18
2015-11-02Characterization of Defects in 2D Materials at Atomic Scale using Aberration Corrected Transmission Electron Microscopy (invited talk)Lee, Zonghoon; Ryu, Gyeong Hee; Park, Hyo ju; Kim, Jung Hwa; Kim, Na YeonCONFERENCE22
Showing results 1 to 2 of 2

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