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Issue DateTitleAuthor(s)TypeView
2014-05Recent progress in scanning electron microscopy for the characterization of fine structural details of nano materialsSuga, Mitsuo; Asahina, Shunsuke; Sakuda, Yusuke; Kazumori, Hiroyoshi; Nishiyama, Hidetoshi; Nokuo, Takeshi; Alfredsson, Viveka; Kjellman, Tomas; Stevens, Sam M.; Cho, Hae Sung; Cho, Minhyung; Han, Lu; Che, Shunai; Anderson, Michael W.; Schueth, Ferdi; Deng, Hexiang; Yaghi, Omar M.; Liu, Zheng; Jeong, Hu Young; Stein, Andreas; Sakamoto, Kazuyuki; Ryoo, Ryong; Terasaki, OsamuARTICLE616
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