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Issue DateTitleAuthor(s)TypeView
2008-04Writing current reduction and total set resistance analysis in PRAMJeong, C. W.; Kang, D. H.; Ha, D. W.; Song, Y. J.; Oh, J. H.; Kong, J. H.; Yoo, J. H.; Park, J. H.; Ryoo, K. C.; Lim, D. W.; Park, S. S.; Kim, J. I.; Oh, Y. T.; Kim, J. S.; Shin, J. M.; Park, Jaehyun; Fai, Y.; Koh, G. H.; Jeong, G. T.; Jeong, H. S.; Kim, KinamARTICLE237
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