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Closed-Form Expressions for the Maximum Transient Noise Voltage Caused by an IC Switching Current on a Power Distribution Network File

Kim, Jingook , Li, Liang , Wu, Songping , Wang, Hanfeng , Takita, Yuzo , Takeuchi, Hayato , Araki, Kenji , Fan, Jun , Drewniak, James L.

Article Issue Date2012-10 View191
Measurement of multiple switching current components through a bulk decoupling capacitor using a lab-made low-cost current probe File

Kim, Jingook , Li, Liang , Wang, Hanfeng , Wu, Songping , Takita, Yuzo , Takeuchi, Hayato , Araki, Kenji , Fan, Jun

Conference Paper Issue Date2011-08-14 View66
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