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Browsing by Author : Lee, T.

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AETTA: Label-Free Accuracy Estimation for Test-Time Adaptation File

Lee, T. , Chottananurak, S. , Gong, Taesik , Lee, S.-J.

Conference Paper Issue Date2024-06-16 View66
First Demonstration of Top-Gate Enhancement- Mode ALD In2O3 FETs With High Thermal Budget of 600 °°C for DRAM Applications File

Lin, Jian-Yu , Zhang, Zhuocheng , Lin, Zehao , Niu, Chang , Zhang, Yizhi , Zhang, Yifan , Kim, Taehyun , Jang, H. , Sung, C. , Hong, M. , et al

Article Issue Date2024-10 View86
SoTTA: Robust Test-Time Adaptation on Noisy Data Streams

Gong, Taesik , Kim, Y. , Lee, T. , Chottananurak, S. , Lee, S.-J.

Conference Paper Issue Date2023-12-10 View65
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