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Issue DateTitleAuthor(s)TypeView
2010-06Conduction and Low-Frequency Noise Analysis in Al/alpha-TiOX/Al Bipolar Switching Resistance Random Access Memory DevicesLee, Jung-Kyu; Jeong, Hu Young; Cho, In-Tak; Lee, Jeong Yong; Choi, Sung-Yool; Kwon, Hyuck-In; Lee, Jong-HoARTICLE562
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