or enter first few letters:
Search
  • Sort by:
  • In order:
  • Results/Page
  • Authors/Record:
Update

Showing results 1 to 20 of 77

Issue DateTitleAuthor(s)TypeView
2014-11-123D 프린팅 제품 및 부품의 신뢰성 평가를 위한 가속 실험 설계Ha, Sangho; Han, Hweeyoung; Yoon, Jeongah; Kim, Namhun; Kwon, DaeilCONFERENCE42
2017-07-12A Digital Signal-based Prognostic Approach to Factory AutomationLee, Jinwoo; Kwon, DaeilCONFERENCE41
2017-02A DIGITAL TECHNIQUE FOR DIAGNOSING INTERCONNECT DEGRADATION BY USING DIGITAL SIGNAL CHARACTERISTICSLee, Jinwoo; Kwon, DaeilARTICLE681
2018-08A dimensional compensation algorithm for vertical bending deformation of 3D printed parts in selective laser sinteringHa, Sangho; Ransikarbum, Kasin; Han, Hweeyoung; Kwon, Daeil; Kim, Hyeonnam; Kim, NamhunARTICLE792
2018-08A Framework for Prognostics and Health Management Applications toward Smart Manufacturing SystemsShin, Insun; Lee, Junmin; Lee, Jun Young; Jung, Kyusung; Kwon, Daeil; Youn, Byeng D.; Jang, Hyun Soo; Choi, Joo-HoARTICLE470
2016-10A model-based prognostic approach to predict interconnect failure using impedance analysisKwon, Daeil; Yoon, JeongahARTICLE677
2015-11-24A Model-based Prognostic Approach to Predict Remaining Useful Life of Inter-connects using Impedance AnalysisKwon, Daeil; Yoon, JeongahCONFERENCE43
2015-05-26A Prognostic Method of Assessing Solder Joint Reliability Based on Digital Signal CharacterizationYoon, Jeongah; Shin, Insun; Park, Juyoung; Kwon, DaeilCONFERENCE54
2016-08-26A SENSORLESS APPROACH OF INTERCONNECT FAILURE DETECTION FOR PROGNOSTICS OF ELECTRONICSLee, Jinwoo; Kwon, DaeilCONFERENCE37
2018-04A similarity based prognostics approach for real time health management of electronics using impedance analysis and SVM regressionLee, Changyong; Kwon, DaeilARTICLE574
2019-05Accelerated Degradation Model for C-rate Loading of Lithium-ion BatteriesSaxena, Saurabh; Kwon, Daeil; Pecht, Michael; Xing, YinjiaoARTICLE389
2013-04-14Accelerated Stress Testing Methodology to Risk Assess Silicon-Package Thermo-Mechanical Failure Modes Resulting from Moisture Exposure under Use ConditionsRangaraj, Sudarshan; Kwon, Daeil; Pei, Min; Hicks, Jeffrey; Leatherman, G; Lucero, Alan; Wilson, Terri; Streit, Sarah; He, JunCONFERENCE25
2019-04Adaptive SVM-based Real-time Quality Assessment for Primer-Sealer Dispensing Process of Sunroof Assembly LineOh, YeongGwang; Ransikarbum, Kasin; Busogi, Moise; Kwon, Daeil; Kim, NamhunARTICLE576
2017-07-12Adaptive SVM-based Real-time Quality Assessment for Primer-Sealer Dispensing Process of Sunroof Assembly LineOh, YeongGwang; Ransikarbum, Kasin; Busogi, Moise; Kwon, Daeil; Kim, NamhunCONFERENCE43
2014-08-25Advances and Challenges in PHM Based Risk Assessment of Electronics SystemsKwon, DaeilCONFERENCE19
2017-01-03Advances and Challenges in Prognostics and Health Management: Need for Interdisciplinary Teaching and LearningKwon, DaeilCONFERENCE32
2017-07-12An Analysis of Quality Monitoring and Control System using Real-Time, Integrated Cost Effectiveness and Support Vector MachineOh, YeongGwang; Ransikarbum, Kasin; Busogi, Moise; Kwon, Daeil; Kim, NamhunCONFERENCE44
2016-02An Approach to Assess Solder Interconnect Degradation Using Digital SignalKwon, Daeil; Yoon, Jeong-ahMaster's thesis993
2016-07-26An Approach to Monitor Interconnect Degradation for Prognostics of Electronics Based on Digital Signal CharacterizationYoon, Jeongah; Kwon, DaeilCONFERENCE51
2020-02Capacity-fading Behavior Analysis for Early Detection of Unhealthy Li-ion BatteriesLee, Changyong; Jo, Sugyeong; Kwon, Daeil; Pecht, MichaelARTICLE128
Showing results 1 to 20 of 77

MENU