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Development of the synchrotron-based EUV interference lithography technique at the PLS-II 8A2 AP-XPS endstation

Yoon, Yongje , Kim, Jung Jin , Shin, Tae Joo

Conference Paper Issue Date2025-11-20 View25
NANO-STRUCTURAL AND NANO-CHEMICAL ANALYSIS OF NI-BASE ALLOY/LOW ALLOY STEEL DISSIMILAR METAL WELD INTERFACES File

Choi, Kyoung Joon , Shin, Sang Hun , Kim, Jung Jin , Jung, Ju Ang , Kim, Ji Hyun

Article Issue Date2012-06 View167
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