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Realistic and Scalable TCAD for Yield-Aware Full-Chip DTCO

Park, Min Chul , Chae, Usuk , Kim, Sangyeon , Kim, Yeji , Kwon, Segab , Lee, Sungyeop , Lee, Ji-Hye , Shin, Byungchul , Jang, Hyunjae , Kim, Namjae , et al

Conference Paper Issue Date2025-06-10 View13
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