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Bias dependence of PBTI degradation mechanism in metal-oxide-semiconductor field effect transistors with La-incorporated hafnium-based dielectric File

Jang, Tae-Young , Kim, Dong-Hyoub , Kim, Jungwoo , Chang, Jun Suk , Jeong, Jae Kyeong , Heo, Yoon-Uk , Kim, Young-Ki , Choi, Changhwan , Park, Hokyung , Choi, Rino

Article Issue Date2011-07 View153
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