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Browsing byAuthorCai, W.
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| Issue Date | Title | Author(s) | Type | View |
|---|---|---|---|---|
| 2009-10 | Nanometer-resolution measurement and modeling of lateral variations of the effective work function at the bilayer Pt/Al/SiO2 interface | Cai, W.; Park, Kibog; Pelz, J.P. | ARTICLE | 987 |
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