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Grain Boundary Character Distribution of Nanocrystalline Cu Thin Films Using Stereological Analysis of Transmission Electron Microscope Orientation Maps File

Darbal, A. D. , Ganesh, K. J. , Liu, X. , Lee, Sukbin , Ledonne, J. , Sun, T. , Yao, B. , Warren, A. P. , Rohrer, G. S. , Rollett, A. D. , et al

Article Issue Date2013-02 View137
Interfacial orientation and misorientation relationships in nanolamellar Cu/Nb composites using transmission-electron-microscope-based orientation and phase mapping File

Liu, X. , Nuhfer, N.T. , Rollett, A.D. , Sinha, S. , Lee, Sukbin , Carpenter, J.S. , LeDonne, J.E. , Darbal, A. , Barmak, K.

Article Issue Date2014-02 View127
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