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Life Test Planning for Improved Reliability Prediction under Limited Time-to-Failure Data

Kwon, Daeil

Conference Paper Issue Date2015-10-23 View9

Lifetime Prediction of Optocouplers in Digital Input and Output Modules based on Bayesian tracking approaches

Shin, Insun , Kwon, Daeil

Conference Paper Issue Date2017-07-12 View8

Lifetime Prediction of Optocouplers in Digital Input and Output Modules based on Bayesian Tracking Approaches File

Shin, Insun , Kwon, Daeil

Article Issue Date2018-08 View5

Managerial and Industrial Information Prognosis: from Business Decision Making to Asset Management

Kwon, Daeil , Shin, Jiseon

Conference Paper Issue Date2018-08-06 View5

Non-Destructive Wire Fault Diagnosis Using Resistance Spectroscopy Analysis

Park, Eunjoo , Kwon, Daeil

Conference Paper Issue Date2018-08-21 View12

Nondestructive Sensing of Interconnect Failure Mechanisms Using Time-Domain Reflectometry File

Kwon, Daeil , Azarian, Michael H. , Pecht, Michael

Article Issue Date2011-05 View13

Optimal Interval Censoring Design for Reliability Prediction of Electronic Packages File File

Kwon, Daeil , Shin, Insun

Article Issue Date2015-06 View8

Optimized Reliability Test Design to Reduce Uncertainties in Reliability Assessment File

Kwon, Daeil , None

Conference Paper Issue Date2012-05-29 View6

Optimized Stress Allocation Strategies for Qualification of Electronic Products

Kwon, Daeil

Conference Paper Issue Date2013-10-06 View6

PHM(Prognostics and Health Management)-based Decision Making with Case Studies

Shin, Jiseon , Lee, Jinwoo , Kwon, Daeil

Conference Paper Issue Date2017-11-18 View6

PHM-based wiring system damage estimation for near zero downtime in manufacturing facilities File

Lee, Jinwoo , Kwon, Daeil , Kim, Namhun , Lee, Changyong

Article Issue Date2019-04 View9

Prognostics and Health Management for Near-Zero Downtime in Smart Manufacturing

Kwon, Daeil

Conference Paper Issue Date2017-12-15 View7

Prognostics Based Early Detection of Electronic Package Failures

Kwon, Daeil

Conference Paper Issue Date2013-12-19 View4

Prognostics of Electronics based on Big-data Analytics and Physics-of-Failure Modeling

Kwon, Daeil

Conference Paper Issue Date2014-05-22 View4

Prognostics of interconnect degradation using RF impedance monitoring and sequential probability ratio test

Kwon, Daeil , Azarian, M.H. , Pecht, M.

Article Issue Date2010-09 View9

Prognostics of Solder Joint Reliability Based on Impedance Analysis and Particle Filtering

Kwon, Daeil

Conference Paper Issue Date2015-04-16 View3

Real-time Diagnosis of Wire Degradation based on Digital Signal Analysis File

Lee, Jinwoo , Kwon, Daeil

Conference Paper Issue Date2017-05-31 View10

Real-time Health Monitoring of Wiring Systems for Smart Manufacturing

Lee, Jinwoo , Kwon, Daeil , Kim, Namhun

Conference Paper Issue Date2018-11-05 View14

Reduction of Li-ion Battery Qualification Time Based on Prognostics and Health Management

이진우 , 권대일

Conference Paper Issue Date2017-10-19 View13

Reduction of Li-ion Battery Qualification Time Based on Prognostics and Health Management File

Kwon, Daeil , Lee, Jinwoo , Pecht, Michael

Article Issue Date2019-09 View12

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