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- Kim, Jingook
- Integrated Circuit and Electromagnetic Compatibility Lab.
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Closed-Form Expressions for the Noise Voltage Caused by a Burst Train of IC Switching Currents on a Power Distribution Network
- Author(s)
- Kim, Jingook, Lee, Jongjoo, Ahn, Seungyoung, Fan, Jun
- Issued Date
- 2014-12
- Citation
- IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.56, no.6, pp.1585 - 1597
- Abstract
- A burst stimulus of data is a common activity in circuits and systems. The supply noise voltage waveform induced by a burst train of integrated circuit (IC) switching currents is rigorously derived for a power distribution network (PDN) with power traces, commonly used in handheld devices. Closed-form expressions are proposed to quickly estimate the amount of voltage drop and overshoot and to develop more complete PDN design methodology as improved target impedances. The proposed PDN noise expressions are also validated with SPICE simulation and measurements using a fabricated IC and PCB.
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- ISSN
- 0018-9375
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