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- Park, Heechun
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Advances in Design and Test of Monolithic 3-D ICs
- Author(s)
- Chaudhuri, Arjun, Banerjee, Sanmitra, Park , Heechun, Kim, Jinwoo, Murali, Gauthaman, Lee, Edward, Kim, Daehyun, Lim, Sung Kyu, Mukhopadhyay, Saibal, Chakrabarty, Krishnendu
- Issued Date
- 2020-08
- Citation
- IEEE DESIGN & TEST, v.37, no.4, pp.92 - 100
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- ISSN
- 2168-2356
- Keyword
- PERFORMANCE
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