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- Park, Heechun
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.endPage | 100 | - |
| dc.citation.number | 4 | - |
| dc.citation.startPage | 92 | - |
| dc.citation.title | IEEE DESIGN & TEST | - |
| dc.citation.volume | 37 | - |
| dc.contributor.author | Chaudhuri, Arjun | - |
| dc.contributor.author | Banerjee, Sanmitra | - |
| dc.contributor.author | Park , Heechun | - |
| dc.contributor.author | Kim, Jinwoo | - |
| dc.contributor.author | Murali, Gauthaman | - |
| dc.contributor.author | Lee, Edward | - |
| dc.contributor.author | Kim, Daehyun | - |
| dc.contributor.author | Lim, Sung Kyu | - |
| dc.contributor.author | Mukhopadhyay, Saibal | - |
| dc.contributor.author | Chakrabarty, Krishnendu | - |
| dc.date.accessioned | 2024-03-13T15:05:09Z | - |
| dc.date.available | 2024-03-13T15:05:09Z | - |
| dc.date.created | 2024-03-13 | - |
| dc.date.issued | 2020-08 | - |
| dc.identifier.bibliographicCitation | IEEE DESIGN & TEST, v.37, no.4, pp.92 - 100 | - |
| dc.identifier.doi | 10.1109/MDAT.2020.2988657 | - |
| dc.identifier.issn | 2168-2356 | - |
| dc.identifier.scopusid | 2-s2.0-85083714437 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/81620 | - |
| dc.identifier.wosid | 000567477900012 | - |
| dc.language | 영어 | - |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
| dc.title | Advances in Design and Test of Monolithic 3-D ICs | - |
| dc.type | Article | - |
| dc.description.isOpenAccess | FALSE | - |
| dc.relation.journalWebOfScienceCategory | Computer Science, Hardware & Architecture; Engineering, Electrical & Electronic | - |
| dc.relation.journalResearchArea | Computer Science; Engineering | - |
| dc.type.docType | Article | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.subject.keywordPlus | PERFORMANCE | - |
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