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김대식

Kim, Dai-Sik
Nano Optics Group
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Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures: erratum

Author(s)
Adam, A. J. L.Brok, J. M.Seo, M. A.Ahn, K. J.Kim, D. S.Kang, J. H.Park, Q. H.Nagel, M.Planken, P. C. M.
Issued Date
2008-05
DOI
10.1364/OE.16.008054
URI
https://scholarworks.unist.ac.kr/handle/201301/54397
Fulltext
https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-16-11-8054&id=160388
Citation
OPTICS EXPRESS, v.16, no.11, pp.8054 - 8054
Abstract
An erratum is presented to correct an error in the discussion section of [Opt. Express. 16, 7407-7417 (2008)] and to add a relevant reference on earlier work.
Publisher
OPTICAL SOC AMER
ISSN
1094-4087

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