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- Kim, Dai-Sik
- Nano Optics Group
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.endPage | 8054 | - |
| dc.citation.number | 11 | - |
| dc.citation.startPage | 8054 | - |
| dc.citation.title | OPTICS EXPRESS | - |
| dc.citation.volume | 16 | - |
| dc.contributor.author | Adam, A. J. L. | - |
| dc.contributor.author | Brok, J. M. | - |
| dc.contributor.author | Seo, M. A. | - |
| dc.contributor.author | Ahn, K. J. | - |
| dc.contributor.author | Kim, D. S. | - |
| dc.contributor.author | Kang, J. H. | - |
| dc.contributor.author | Park, Q. H. | - |
| dc.contributor.author | Nagel, M. | - |
| dc.contributor.author | Planken, P. C. M. | - |
| dc.date.accessioned | 2023-12-22T08:40:07Z | - |
| dc.date.available | 2023-12-22T08:40:07Z | - |
| dc.date.created | 2021-10-21 | - |
| dc.date.issued | 2008-05 | - |
| dc.description.abstract | An erratum is presented to correct an error in the discussion section of [Opt. Express. 16, 7407-7417 (2008)] and to add a relevant reference on earlier work. | - |
| dc.identifier.bibliographicCitation | OPTICS EXPRESS, v.16, no.11, pp.8054 - 8054 | - |
| dc.identifier.doi | 10.1364/OE.16.008054 | - |
| dc.identifier.issn | 1094-4087 | - |
| dc.identifier.scopusid | 2-s2.0-44649121494 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/54397 | - |
| dc.identifier.url | https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-16-11-8054&id=160388 | - |
| dc.identifier.wosid | 000256469900052 | - |
| dc.language | 영어 | - |
| dc.publisher | OPTICAL SOC AMER | - |
| dc.title | Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures: erratum | - |
| dc.type | Article | - |
| dc.description.isOpenAccess | FALSE | - |
| dc.relation.journalWebOfScienceCategory | Optics | - |
| dc.relation.journalResearchArea | Optics | - |
| dc.type.docType | Article | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
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