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Ruoff, Rodney S.
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Scanning tunnelling microscopy of suspended graphene

Author(s)
Zan, RecepMuryn, ChrisBangert, UrselMattocks, PhilipWincott, PaulVaughan, DavidLi, XuesongColombo, LuigiRuoff, Rodney S.Hamilton, BruceNovoselov, Konstantin S.
Issued Date
2012
DOI
10.1039/c2nr30162h
URI
https://scholarworks.unist.ac.kr/handle/201301/54276
Fulltext
https://pubs.rsc.org/en/content/articlelanding/2012/NR/c2nr30162h
Citation
NANOSCALE, v.4, no.10, pp.3065 - 3068
Abstract
Suspended graphene has been studied by STM for the first time. Atomic resolution on mono- and bi-layer graphene samples has been obtained after ridding the graphene surface of contamination via high-temperature annealing. Static local corrugations (ripples) have been observed on both types of structures.
Publisher
ROYAL SOC CHEMISTRY
ISSN
2040-3364
Keyword
LARGE-AREAFILMS

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