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DC Field | Value | Language |
---|---|---|
dc.citation.endPage | 3068 | - |
dc.citation.number | 10 | - |
dc.citation.startPage | 3065 | - |
dc.citation.title | NANOSCALE | - |
dc.citation.volume | 4 | - |
dc.contributor.author | Zan, Recep | - |
dc.contributor.author | Muryn, Chris | - |
dc.contributor.author | Bangert, Ursel | - |
dc.contributor.author | Mattocks, Philip | - |
dc.contributor.author | Wincott, Paul | - |
dc.contributor.author | Vaughan, David | - |
dc.contributor.author | Li, Xuesong | - |
dc.contributor.author | Colombo, Luigi | - |
dc.contributor.author | Ruoff, Rodney S. | - |
dc.contributor.author | Hamilton, Bruce | - |
dc.contributor.author | Novoselov, Konstantin S. | - |
dc.date.accessioned | 2023-12-22T05:37:42Z | - |
dc.date.available | 2023-12-22T05:37:42Z | - |
dc.date.created | 2021-10-18 | - |
dc.date.issued | 2012 | - |
dc.description.abstract | Suspended graphene has been studied by STM for the first time. Atomic resolution on mono- and bi-layer graphene samples has been obtained after ridding the graphene surface of contamination via high-temperature annealing. Static local corrugations (ripples) have been observed on both types of structures. | - |
dc.identifier.bibliographicCitation | NANOSCALE, v.4, no.10, pp.3065 - 3068 | - |
dc.identifier.doi | 10.1039/c2nr30162h | - |
dc.identifier.issn | 2040-3364 | - |
dc.identifier.scopusid | 2-s2.0-84860704868 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/54276 | - |
dc.identifier.url | https://pubs.rsc.org/en/content/articlelanding/2012/NR/c2nr30162h | - |
dc.identifier.wosid | 000303604000012 | - |
dc.language | 영어 | - |
dc.publisher | ROYAL SOC CHEMISTRY | - |
dc.title | Scanning tunnelling microscopy of suspended graphene | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied | - |
dc.relation.journalResearchArea | Chemistry; Science & Technology - Other Topics; Materials Science; Physics | - |
dc.type.docType | Article | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | LARGE-AREA | - |
dc.subject.keywordPlus | FILMS | - |
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