File Download
There are no files associated with this item.
SFX Link
- Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
- Kim, Jingook
- Integrated Circuit and Electromagnetic Compatibility Lab.
Views & Downloads
Detailed Information
Cited time in 
Cited time in 
Cited time in
Metadata Downloads
Measurement of multiple switching current components through a bulk decoupling capacitor using a lab-made low-cost current probe
- Author(s)
- Kim, Jingook, Li, Liang, Wang, Hanfeng, Wu, Songping, Takita, Yuzo, Takeuchi, Hayato, Araki, Kenji, Fan, Jun
- Issued Date
- 2011-08-14
- Citation
- 2011 IEEE International Symposium on Electromagnetic Compatibility, pp.417 - 421
- Abstract
- This paper presents a measurement-based data-processing approach to obtain parameters of multiple current components through a bulk decoupling capacitor for power integrity studies. A lab-made low-cost current probe is developed to measure the induced voltage due to the time-varying switching current. Then, a post data-processing procedure is introduced to separate and obtain the parameters of multiple current components. The results obtained by the proposed method are validated with other approaches.
- Publisher
- 2011 IEEE International Symposium on Electromagnetic Compatibility
- ISSN
- 1077-4076
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.