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- Kim, Jingook
- Integrated Circuit and Electromagnetic Compatibility Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.conferencePlace | Long Beach, CA | - |
| dc.citation.endPage | 421 | - |
| dc.citation.startPage | 417 | - |
| dc.citation.title | 2011 IEEE International Symposium on Electromagnetic Compatibility | - |
| dc.contributor.author | Kim, Jingook | - |
| dc.contributor.author | Li, Liang | - |
| dc.contributor.author | Wang, Hanfeng | - |
| dc.contributor.author | Wu, Songping | - |
| dc.contributor.author | Takita, Yuzo | - |
| dc.contributor.author | Takeuchi, Hayato | - |
| dc.contributor.author | Araki, Kenji | - |
| dc.contributor.author | Fan, Jun | - |
| dc.date.accessioned | 2023-12-20T03:05:57Z | - |
| dc.date.available | 2023-12-20T03:05:57Z | - |
| dc.date.created | 2015-07-01 | - |
| dc.date.issued | 2011-08-14 | - |
| dc.description.abstract | This paper presents a measurement-based data-processing approach to obtain parameters of multiple current components through a bulk decoupling capacitor for power integrity studies. A lab-made low-cost current probe is developed to measure the induced voltage due to the time-varying switching current. Then, a post data-processing procedure is introduced to separate and obtain the parameters of multiple current components. The results obtained by the proposed method are validated with other approaches. | - |
| dc.identifier.bibliographicCitation | 2011 IEEE International Symposium on Electromagnetic Compatibility, pp.417 - 421 | - |
| dc.identifier.doi | 10.1109/ISEMC.2011.6038347 | - |
| dc.identifier.issn | 1077-4076 | - |
| dc.identifier.scopusid | 2-s2.0-80054770795 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/46813 | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/6038347 | - |
| dc.language | 영어 | - |
| dc.publisher | 2011 IEEE International Symposium on Electromagnetic Compatibility | - |
| dc.title | Measurement of multiple switching current components through a bulk decoupling capacitor using a lab-made low-cost current probe | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2011-08-14 | - |
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