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dc.citation.conferencePlace KO -
dc.citation.conferencePlace Daejeon -
dc.citation.endPage 73 -
dc.citation.startPage 69 -
dc.citation.title 23rd IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 -
dc.contributor.author Lee, Jaemin -
dc.contributor.author Kim, Seungwon -
dc.contributor.author Kim, Youngmin -
dc.contributor.author Kang, Seokhyeong -
dc.date.accessioned 2023-12-19T22:06:07Z -
dc.date.available 2023-12-19T22:06:07Z -
dc.date.created 2019-03-25 -
dc.date.issued 2015-10-05 -
dc.description.abstract For applications related to human, such as Internet of Things (IoT) and wearable devices, near threshold voltage (NTV) technology has been proposed for the trade-off between performance and energy consumption. However, error-resilient techniques are required in the circuits to improve reliability of the NTV operation.
In this paper, we propose a low-overhead error-resilient system and a design flow for NTV operations. We use a new monitoring circuit, which can detect timing errors and find an optimal operation point of the system. Also, we propose two different methodologies, which are slack-based methodology and sensitivity-based methodology.
From the proposed monitoring system and the sensitivitybased sorting algorithm, benchmark results show that the optimal designs provide up to 46% monitoring area reduction maintaining similar error detection ability of the conventional error-resilient design.
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dc.identifier.bibliographicCitation 23rd IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, pp.69 - 73 -
dc.identifier.doi 10.1109/VLSI-SoC.2015.7314394 -
dc.identifier.issn 2324-8432 -
dc.identifier.scopusid 2-s2.0-84960080664 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/34972 -
dc.identifier.url https://ieeexplore.ieee.org/document/7314394 -
dc.language 영어 -
dc.publisher IEEE Computer Society -
dc.title An optimal operating point by using error monitoring circuits with an error-resilient technique -
dc.type Conference Paper -
dc.date.conferenceDate 2015-10-05 -

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