BROWSE

Related Researcher

Author

Lee, Zonghoon
Atomic-Scale Electron Microscopy (ASEM) Lab
Research Interests
  • Advanced Transmission Electron Microscopy (TEM/STEM), in Situ TEM, graphene, 2D materials, low-dimensional crystals, nanostructured materials

ITEM VIEW & DOWNLOAD

Grain Boundary Mapping in Polycrystalline Graphene

Cited 191 times inthomson ciCited 178 times inthomson ci
Title
Grain Boundary Mapping in Polycrystalline Graphene
Author
Kim, KwanpyoLee, ZonghoonRegan, WilliamKisielowski, C.Crommie, M. F.Zettl, A.
Keywords
Atomic arrangement; Boundary mapping; Conventional TEM; Dark field imaging; Direct mapping; grain; Graphene sheets; Length scale; polycrystalline; Scanning transmission electron microscopy; TEM
Issue Date
201103
Publisher
AMER CHEMICAL SOC
Citation
ACS NANO, v.5, no.3, pp.2142 - 2146
Abstract
We report direct mapping of the grains and grain boundaries (GBs) of large-area monolayer polycrystalline graphene sheets, at large (several micrometer) and single-atom length scales. Global grain and GB mapping is performed using electron diffraction in scanning transmission electron microscopy (STEM) or using dark-field imaging in conventional TEM. Additionally, we employ aberration-corrected TEM to extract direct images of the local atomic arrangements of graphene GBs, which reveal the alternating pentagon-heptagon structure along high-angle GBs. Our findings provide a readily adaptable tool for graphene GB studies.
URI
Go to Link
DOI
http://dx.doi.org/10.1021/nn1033423
ISSN
1936-0851
Appears in Collections:
MSE_Journal Papers

find_unist can give you direct access to the published full text of this article. (UNISTARs only)

Show full item record

qr_code

  • mendeley

    citeulike

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

MENU