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Nitrogen contribution to N-doped GeTe (N: 8.4 at.%) in the structural phase transition
- Author(s)
- Lee, Y. M., Shin, H. J., Choi, S. J., Oh, J. H., Jeong, H. S., Kim, K., Jung, M. -C.
- Issued Date
- 2011-05
- Citation
- CURRENT APPLIED PHYSICS, v.11, no.3, pp.710 - 713
- Abstract
- Chemical states of N-doped GeTe (N: 8.4 at.%) thin film (NGT) in structural phase transition were investigated by near-edge x-ray absorption of fine structure and high-resolution x-ray photoelectron spectroscopy with synchrotron radiation. We found the NaCl-like structure in NGT by x-ray diffraction at around 300 degrees C. Preparatory to the analysis of chemical states, after mild Ne+ sputtering we obtained clean amorphous NGT, which showed the N-2 vibration mode peak in the N K-edge absorption spectrum. After annealing, the N-2 molecular peak disappeared completely and we assumed that nitrogen was contributed only to the Ge atom in structural phase transition by analyzing Ge 3d and Te 4d core-levels.
- Publisher
- ELSEVIER SCIENCE BV
- ISSN
- 1567-1739
- Keyword (Author)
- N-doped GeTe, Structural phase transition, Chemical state, NEXAFS, XPS
- Keyword
- X-RAY PHOTOEMISSION
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