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정창욱

Jeong, Changwook
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A new reference signal generation method for MRAM using a 90-degree rotated MTJ

Author(s)
Jeong, WCKim, HJPark, JHJeong, ChangwookLee, EYOh, JHJeong, GTKoh, GHKoo, HCLee, SHLee, SYShin, JMJeong, HongsikKim, K
Issued Date
2004-07
DOI
10.1109/TMAG.2004.829328
URI
https://scholarworks.unist.ac.kr/handle/201301/27115
Fulltext
https://ieeexplore.ieee.org/document/1325590
Citation
IEEE TRANSACTIONS ON MAGNETICS, v.40, no.4, pp.2628 - 2630
Abstract
A new reference signal generation method for high-density MRAM is reported. 0.4 x 0.8 mum(2) magnetic tunnel junction (MTJ) elements were successfully integrated with 0.24-mum CMOS technology. By using a 90-degree rotated MTJ as a new reference signal generator, the reference resistance could be always located in the exact midpoint between high-resistance state R-H and low-resistance state R-L regardless of applied voltage. When tested in 8 x 8 MTJ arrays, it is found to show good fidelity to our expectations. So it is supposed that this new method is more favorable for high-density MRAM.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
ISSN
0018-9464
Keyword (Author)
magnetic tunnel junction (MTJ)magnetic random access memory (MRAM)reference celltunneling magnetoresistance (TMR)

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