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Yoon, Heein
Advanced Circuits and Electronics Lab.
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A Low-Jitter Injection-Locked Multi-Frequency Generator Using Digitally Controlled Oscillators and Time-Interleaved Calibration

Author(s)
Yoon, HeeinPark, SuneuiChoi, Jaehyouk
Issued Date
2019-06
DOI
10.1109/JSSC.2019.2893513
URI
https://scholarworks.unist.ac.kr/handle/201301/27030
Fulltext
https://ieeexplore.ieee.org/document/8637949
Citation
IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.54, no.6, pp.1564 - 1574
Abstract
This paper presents a low-jitter, injection-locked frequency generator that can provide multiple output frequencies concurrently. The injection-locked digitally controlled oscillators (DCOs) can be controlled separately so that their output frequencies can be changed independently between 0.9 and 1.2 GHz in 15-MHz steps. Due to the proposed time-interleaved frequency calibrator that operates continuously in the background, all injection-locked DCOs are ensured to maintain excellent jitter performance against process, voltage, and temperature (PVT) variations. As a prototype, the proposed injection-locked, multi-frequency generator (ILMFG) was designed to generate two independently controlled output signals, and it was fabricated in a 65-nm CMOS technology. The 1-MHz phase noise and the rms jitter integrated from 1 kHz to 40 MHz of the 960-MHz output signal were -133.5 dBc/Hz and 375 fs, respectively. The degradation of rms jitter was restricted to less than 10%. The silicon area was 0.05 mm(2), and the total power consumption was 7.7 mW when generating two different output frequencies.
Publisher
Institute of Electrical and Electronics Engineers Inc.
ISSN
0018-9200
Keyword (Author)
Clock multiplierdigitally controlled oscillator (DCO)fractional resolutionfrequency synthesizerinjection lockingjittermulti-frequency generatorphase noisereplicatime-interleaved
Keyword
Frequency synthesizersPhase noiseClock multipliersDigitally controlled oscillatorsInjection-lockingMulti frequencyreplicaTime-interleavedJitter

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