Ultrafast Electron Energy-Loss Spectroscopy in Transmission Electron Microscopy
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- Ultrafast Electron Energy-Loss Spectroscopy in Transmission Electron Microscopy
- Pomarico, Enrico; Kim, Ye‐Jin; de Abajo, F. Javier García; Kwon, Oh-Hoon; Carbone, Fabrizio; van der Veen, Renske M
- Issue Date
- CAMBRIDGE UNIV PRESS
- MRS BULLETIN, v.43, no.7, pp.497 - 503
- In the quest for dynamic multimodal probing of a material’s structure and functionality, it is critical to be able to quantify the chemical state on the atomic-/nanoscale using element-specific electronic and structurally sensitive tools such as electron energy-loss spectroscopy (EELS). Ultrafast EELS, with combined energy, time, and spatial resolution in a transmission electron microscope, has recently enabled transformative studies of photoexcited nanostructure evolution and mapping of evanescent electromagnetic fields. This article aims to describe state-of-the-art experimental techniques in this emerging field and its major uses and future applications.
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