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Kim, Duck Young
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Empirical Sensitivity Analysis of Discretization Parameters for Fault Pattern Extraction From Multivariate Time Series Data

Author(s)
Baek, SujeongKim, Duck Young
Issued Date
2017-05
DOI
10.1109/TCYB.2016.2540657
URI
https://scholarworks.unist.ac.kr/handle/201301/19097
Fulltext
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7444175
Citation
IEEE TRANSACTIONS ON CYBERNETICS, v.47, no.5, pp.1198 - 1209
Abstract
It has been a challenge to find patterns in a time series of sensor data for fault detection in a system. Since it is usually not straightforward to discover meaningful features and rules directly from complex time series, data discretization has been popularly employed to reduce data size while preserving meaningful features from the original data, for which the choice of appropriate discretization parameters is crucial. We thus present a systematic discretization procedure of multivariate time series data that includes: 1) label definition in consideration of the estimated distribution functions of sensor signals and the trends of signal's short-term variation and 2) label specification to a set of time segments in order to describe the state of a given system for the time segment as a discretized state vector. Formal definitions of fault patterns and discretization problems are made to conduct empirical sensitivity analysis of discretization parameters in finding the most informative fault patterns. We then investigate the relationship between the parameters and the key characteristic indicators of sensor signals. The computational results with the ten real-world data sets provide a practical advice to select appropriate parameters.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
ISSN
2168-2267
Keyword (Author)
Discretizationfault detectionpattern extractionsensitivity analysistime series
Keyword
DISCOVERYCLASSIFICATIONREPRESENTATIONALGORITHMDIAGNOSISKNOWLEDGESYSTEMS

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