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dc.citation.endPage 1209 -
dc.citation.number 5 -
dc.citation.startPage 1198 -
dc.citation.title IEEE TRANSACTIONS ON CYBERNETICS -
dc.citation.volume 47 -
dc.contributor.author Baek, Sujeong -
dc.contributor.author Kim, Duck Young -
dc.date.accessioned 2023-12-21T22:17:27Z -
dc.date.available 2023-12-21T22:17:27Z -
dc.date.created 2016-05-02 -
dc.date.issued 2017-05 -
dc.description.abstract It has been a challenge to find patterns in a time series of sensor data for fault detection in a system. Since it is usually not straightforward to discover meaningful features and rules directly from complex time series, data discretization has been popularly employed to reduce data size while preserving meaningful features from the original data, for which the choice of appropriate discretization parameters is crucial. We thus present a systematic discretization procedure of multivariate time series data that includes: 1) label definition in consideration of the estimated distribution functions of sensor signals and the trends of signal's short-term variation and 2) label specification to a set of time segments in order to describe the state of a given system for the time segment as a discretized state vector. Formal definitions of fault patterns and discretization problems are made to conduct empirical sensitivity analysis of discretization parameters in finding the most informative fault patterns. We then investigate the relationship between the parameters and the key characteristic indicators of sensor signals. The computational results with the ten real-world data sets provide a practical advice to select appropriate parameters. -
dc.identifier.bibliographicCitation IEEE TRANSACTIONS ON CYBERNETICS, v.47, no.5, pp.1198 - 1209 -
dc.identifier.doi 10.1109/TCYB.2016.2540657 -
dc.identifier.issn 2168-2267 -
dc.identifier.scopusid 2-s2.0-84962622865 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/19097 -
dc.identifier.url http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7444175 -
dc.identifier.wosid 000399797000007 -
dc.language 영어 -
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC -
dc.title Empirical Sensitivity Analysis of Discretization Parameters for Fault Pattern Extraction From Multivariate Time Series Data -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Automation & Control Systems; Computer Science, Artificial Intelligence; Computer Science, Cybernetics -
dc.relation.journalResearchArea Automation & Control Systems; Computer Science -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Discretization -
dc.subject.keywordAuthor fault detection -
dc.subject.keywordAuthor pattern extraction -
dc.subject.keywordAuthor sensitivity analysis -
dc.subject.keywordAuthor time series -
dc.subject.keywordPlus DISCOVERY -
dc.subject.keywordPlus CLASSIFICATION -
dc.subject.keywordPlus REPRESENTATION -
dc.subject.keywordPlus ALGORITHM -
dc.subject.keywordPlus DIAGNOSIS -
dc.subject.keywordPlus KNOWLEDGE -
dc.subject.keywordPlus SYSTEMS -

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