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사진

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Kim, Jingook (김진국)

Department
School of Electrical and Computer Engineering(전기전자컴퓨터공학부)
Research Interests
Convergence between circuit and EM domains
Lab
Integrated Circuit and Electromagnetic Compatibility Laboratory (IC & EMC Lab)
Website
http://icemclab.unist.ac.kr/
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Issue DateTitleAuthor(s)TypeViewAltmetrics
201901Spread Spectrum Technique for Decreasing EM Noise in High Frequency APWM HB Resonant Converter with Reduced EMI Filter SizePark, Hwa-Pyeong; Jeong, Sangyoung; Kim, Mina, et alARTICLE37 Spread Spectrum Technique for Decreasing EM Noise in High Frequency APWM HB Resonant Converter with Reduced EMI Filter Size
201810Precise Analytical Model of Power Supply Induced Jitter Transfer Function at Inverter ChainsKim, Heegon; Kim, Jingook; Fan, Jun, et alARTICLE170 Precise Analytical Model of Power Supply Induced Jitter Transfer Function at Inverter Chains
201808Quantified Design Guidelines of a Compact Transformerless Active EMI Filter for Performance, Stability, and High Voltage ImmunityShin, Dongil; Jeong, Sangyeong; Kim, JingookARTICLE185 Quantified Design Guidelines of a Compact Transformerless Active EMI Filter for Performance, Stability, and High Voltage Immunity
201806A Transformer-Isolated Common-Mode Active EMI Filter without Additional Components on Power LinesJeong, Sangyeong; Shin, Dongil; Kim, JingookARTICLE29 A Transformer-Isolated Common-Mode Active EMI Filter without Additional Components on Power Lines
201805Measurement and Analysis of Statistical IC Operation Errors in a Memory Module Due to System-Level ESD NoisePark, Myungjoon; Park, Junsik; Choi, Jongcheul, et alARTICLE23 Measurement and Analysis of Statistical IC Operation Errors in a Memory Module Due to System-Level ESD Noise
201804Near-Field Validation of Dipole-Moment Model Extracted From GTEM Cell Measurements and Application to a Real Application ProcessorKwak, Kyungjin; Kim, Jaehyuk; Kim, JingookARTICLE283 Near-Field Validation of Dipole-Moment Model Extracted From GTEM Cell Measurements and Application to a Real Application Processor
201712IC Failure Analysis Due to Charged Board Events by Measurements and Modeling of Discharging Currents Through IC PinsPark, Junsik; Lee, Jongsung; Jo, Cheolgu, et alARTICLE183 IC Failure Analysis Due to Charged Board Events by Measurements and Modeling of Discharging Currents Through IC Pins
201712Sensitivity Analysis of a Circuit Model for Power Distribution Network in a Multilayered Printed Circuit BoardShringarpure, Ketan; Pan, Siming; Kim, Jingook, et alARTICLE1710 Sensitivity Analysis of a Circuit Model for Power Distribution Network in a Multilayered Printed Circuit Board
201710An Effective Experimental Optimization Method for Wireless Power Transfer System Design Using Frequency Domain MeasurementJeong, Sangyeong; Kim, Mina; Jung, Jee-Hoon, et alARTICLE264 An Effective Experimental Optimization Method for Wireless Power Transfer System Design Using Frequency Domain Measurement
201704Quantified Design Guides for the Reduction of Radiated Emissions in Package-Level Power Distribution NetworksShin, Dongil; Kim, Namsu; Lee, Jongjoo, et alARTICLE350 Quantified Design Guides for the Reduction of Radiated Emissions in Package-Level Power Distribution Networks
201701Statistical Analysis for Pattern-Dependent Simultaneous Switching Outputs (SSO) of Parallel Single-Ended BuffersKim, JingookARTICLE202 Statistical Analysis for Pattern-Dependent Simultaneous Switching Outputs (SSO) of Parallel Single-Ended Buffers
201701Fast and Accurate Calculation of System-Level ESD Noise Coupling to a Signal Trace by PEEC Model DecompositionPark, Junsik; Lee, Jongsung; Seol, Byongsu, et alARTICLE294 Fast and Accurate Calculation of System-Level ESD Noise Coupling to a Signal Trace by PEEC Model Decomposition
201611High-frequency testing of vertical interconnection array using indirect contact probing method with an improved calibrationJeong, Jongwoo; Kim, Jingook; Kang, No-Weon, et alARTICLE344 High-frequency testing of vertical interconnection array using indirect contact probing method with an improved calibration
201606Formulation and Network Model Reduction for Analysis of the Power Distribution Network in a Production-Level Multilayered Printed Circuit BoardShringarpure, Ketan; Pan, Siming; Kim, Jingook, et alARTICLE191 Formulation and Network Model Reduction for Analysis of the Power Distribution Network in a Production-Level Multilayered Printed Circuit Board
2016A slope and amplitude controllable triangular-current generator for the injection of a broad-band PDN noiseYoon C.; Kim, Jingook; Kim, Sukjin, et alARTICLE182 A slope and amplitude controllable triangular-current generator for the injection of a broad-band PDN noise
201508An Enhanced Statistical Analysis Method for I/O Links Considering Supply Voltage Fluctuations and Inter-Symbol-InterferenceKim, Jingook; Lee, Jongjoo; Park, Eunkyeong, et alARTICLE317 An Enhanced Statistical Analysis Method for I/O Links Considering Supply Voltage Fluctuations and Inter-Symbol-Interference
201508Analytical Calculation of Jitter Probability Density at Multistage Output Buffers Due to Supply Voltage FluctuationsPark, Eunkyeong; Kim, Hyungsoo; Shim, Jongjoo, et alARTICLE472 Analytical Calculation of Jitter Probability Density at Multistage Output Buffers Due to Supply Voltage Fluctuations
201508Efficient Calculation of Inductive and Capacitive Coupling Due to Electrostatic Discharge (ESD) Using PEEC MethodPark, Junsik; Lee, Jongsung; Seol, Byongsu, et alARTICLE500 Efficient Calculation of Inductive and Capacitive Coupling Due to Electrostatic Discharge (ESD) Using PEEC Method
201508Design Criteria and Error Sensitivity of Time-Domain Channel Characterization (TCC) for Asymmetry Fixture De-EmbeddingYoon, Changwook; Tsiklauri, Mikheil; Zvonkin, Mikhail, et alARTICLE753 Design Criteria and Error Sensitivity of Time-Domain Channel Characterization (TCC) for Asymmetry Fixture De-Embedding
201508Analysis and Design Guide of Active EMI Filter in a Compact Package for Reduction of Common-Mode Conducted EmissionsShin, Dongil; Kim, Sungnam; Park, Jaesu, et alARTICLE601 Analysis and Design Guide of Active EMI Filter in a Compact Package for Reduction of Common-Mode Conducted Emissions

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