사진

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Kim, Jingook (김진국)

Department
School of Electrical and Computer Engineering(전기전자컴퓨터공학부)
Research Interests
Convergence between circuit and EM domains
Lab
Integrated Circuit and Electromagnetic Compatibility Laboratory (IC & EMC Lab)
Website
http://icemclab.unist.ac.kr/
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Issue DateTitleAuthor(s)TypeViewAltmetrics
2019-11Spread Spectrum Technique for Decreasing EM Noise in High-Frequency APWM HB Resonant Converter With Reduced EMI Filter SizePark, Hwa-Pyeong; Jeong, Sangyoung; Kim, Mina, et alARTICLE155 Spread Spectrum Technique for Decreasing EM Noise in High-Frequency APWM HB Resonant Converter With Reduced EMI Filter Size
2019-05Accuracy Investigation of a Neuromorphic Machine Learning System due to Electromagnetic Noises using PEEC ModelLee, Wooryong; Kim, JingookARTICLE58 Accuracy Investigation of a Neuromorphic Machine Learning System due to Electromagnetic Noises using PEEC Model
2019-04A Balanced Feedforward Current-Sense Current-Compensation Active EMI Filter for Common-Mode Noise ReductionShin, Dongil; Jeong, Sangyeong; Baek, Youngjin, et alARTICLE63 A Balanced Feedforward Current-Sense Current-Compensation Active EMI Filter for Common-Mode Noise Reduction
2019-03A Transformer-Isolated Common-Mode Active EMI Filter without Additional Components on Power LinesJeong, Sangyeong; Shin, Dongil; Kim, JingookARTICLE108 A Transformer-Isolated Common-Mode Active EMI Filter without Additional Components on Power Lines
2019-02Measurement and Analysis of Statistical IC Operation Errors in a Memory Module Due to System-Level ESD NoisePark, Myungjoon; Park, Junsik; Choi, Jongcheul, et alARTICLE138 Measurement and Analysis of Statistical IC Operation Errors in a Memory Module Due to System-Level ESD Noise
2018-10Precise Analytical Model of Power Supply Induced Jitter Transfer Function at Inverter ChainsKim, Heegon; Kim, Jingook; Fan, Jun, et alARTICLE313 Precise Analytical Model of Power Supply Induced Jitter Transfer Function at Inverter Chains
2018-10A Cost-Effective Structure for Secondary Discharge Control to Improve System-Level ESD Immunity of a Mobile ProductPark, Junsik; Lee, Jongsung; Jo, Cheolgu, et alARTICLE56 A Cost-Effective Structure for Secondary Discharge Control to Improve System-Level ESD Immunity of a Mobile Product
2018-08Quantified Design Guidelines of a Compact Transformerless Active EMI Filter for Performance, Stability, and High Voltage ImmunityShin, Dongil; Jeong, Sangyeong; Kim, JingookARTICLE315 Quantified Design Guidelines of a Compact Transformerless Active EMI Filter for Performance, Stability, and High Voltage Immunity
2018-04Near-Field Validation of Dipole-Moment Model Extracted From GTEM Cell Measurements and Application to a Real Application ProcessorKwak, Kyungjin; Kim, Jaehyuk; Kim, JingookARTICLE408 Near-Field Validation of Dipole-Moment Model Extracted From GTEM Cell Measurements and Application to a Real Application Processor
2017-12Sensitivity Analysis of a Circuit Model for Power Distribution Network in a Multilayered Printed Circuit BoardShringarpure, Ketan; Pan, Siming; Kim, Jingook, et alARTICLE1860 Sensitivity Analysis of a Circuit Model for Power Distribution Network in a Multilayered Printed Circuit Board
2017-12IC Failure Analysis Due to Charged Board Events by Measurements and Modeling of Discharging Currents Through IC PinsPark, Junsik; Lee, Jongsung; Jo, Cheolgu, et alARTICLE308 IC Failure Analysis Due to Charged Board Events by Measurements and Modeling of Discharging Currents Through IC Pins
2017-10An Effective Experimental Optimization Method for Wireless Power Transfer System Design Using Frequency Domain MeasurementJeong, Sangyeong; Kim, Mina; Jung, Jee-Hoon, et alARTICLE397 An Effective Experimental Optimization Method for Wireless Power Transfer System Design Using Frequency Domain Measurement
2017-04Quantified Design Guides for the Reduction of Radiated Emissions in Package-Level Power Distribution NetworksShin, Dongil; Kim, Namsu; Lee, Jongjoo, et alARTICLE484 Quantified Design Guides for the Reduction of Radiated Emissions in Package-Level Power Distribution Networks
2017-01Fast and Accurate Calculation of System-Level ESD Noise Coupling to a Signal Trace by PEEC Model DecompositionPark, Junsik; Lee, Jongsung; Seol, Byongsu, et alARTICLE415 Fast and Accurate Calculation of System-Level ESD Noise Coupling to a Signal Trace by PEEC Model Decomposition
2017-01Statistical Analysis for Pattern-Dependent Simultaneous Switching Outputs (SSO) of Parallel Single-Ended BuffersKim, JingookARTICLE327 Statistical Analysis for Pattern-Dependent Simultaneous Switching Outputs (SSO) of Parallel Single-Ended Buffers
2016-12A slope and amplitude controllable triangular-current generator for the injection of a broad-band PDN noiseYoon, Changwook; Kim, Jingook; Kim, Sukjin, et alARTICLE286 A slope and amplitude controllable triangular-current generator for the injection of a broad-band PDN noise
2016-11High-frequency testing of vertical interconnection array using indirect contact probing method with an improved calibrationJeong, Jongwoo; Kim, Jingook; Kang, No-Weon, et alARTICLE462 High-frequency testing of vertical interconnection array using indirect contact probing method with an improved calibration
2016-06Formulation and Network Model Reduction for Analysis of the Power Distribution Network in a Production-Level Multilayered Printed Circuit BoardShringarpure, Ketan; Pan, Siming; Kim, Jingook, et alARTICLE309 Formulation and Network Model Reduction for Analysis of the Power Distribution Network in a Production-Level Multilayered Printed Circuit Board
2015-08Analysis and Design Guide of Active EMI Filter in a Compact Package for Reduction of Common-Mode Conducted EmissionsShin, Dongil; Kim, Sungnam; Park, Jaesu, et alARTICLE764 Analysis and Design Guide of Active EMI Filter in a Compact Package for Reduction of Common-Mode Conducted Emissions
2015-08Design Criteria and Error Sensitivity of Time-Domain Channel Characterization (TCC) for Asymmetry Fixture De-EmbeddingYoon, Changwook; Tsiklauri, Mikheil; Zvonkin, Mikhail, et alARTICLE875 Design Criteria and Error Sensitivity of Time-Domain Channel Characterization (TCC) for Asymmetry Fixture De-Embedding

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