사진

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Kim, Jingook (김진국)

Department
School of Electrical and Computer Engineering(전기전자컴퓨터공학부)
Research Interests
Convergence between circuit and EM domains
Lab
Integrated Circuit and Electromagnetic Compatibility Laboratory (IC & EMC Lab)
Website
http://icemclab.unist.ac.kr/
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Issue DateTitleAuthor(s)TypeViewAltmetrics
2019-12A Proposed Terminal-Ground EMI Filter for Reduction of Conducted Emissions Considering Cable Radiation and SafetyJeong, Sangyeong; Kwak, Kyungjin; Park, Gwigeun, et alARTICLE104 A Proposed Terminal-Ground EMI Filter for Reduction of Conducted Emissions Considering Cable Radiation and Safety
2019-11Spread Spectrum Technique for Decreasing EM Noise in High-Frequency APWM HB Resonant Converter With Reduced EMI Filter SizePark, Hwa-Pyeong; Jeong, Sangyoung; Kim, Mina, et alARTICLE306 Spread Spectrum Technique for Decreasing EM Noise in High-Frequency APWM HB Resonant Converter With Reduced EMI Filter Size
2019-10Accuracy Investigation of a Neuromorphic Machine Learning System Due to Electromagnetic Noises Using PEEC ModelLee, Wooryong; Kim, JingookARTICLE166 Accuracy Investigation of a Neuromorphic Machine Learning System Due to Electromagnetic Noises Using PEEC Model
2019-09Measurement and Analysis of System-Level ESD-Induced Jitter in a Delay-Locked LoopJeong, Myeongjo; Shin, Minchul; Kim, Jinwoo, et alARTICLE86 Measurement and Analysis of System-Level ESD-Induced Jitter in a Delay-Locked Loop
2019-04A Balanced Feedforward Current-Sense Current-Compensation Active EMI Filter for Common-Mode Noise ReductionShin, Dongil; Jeong, Sangyeong; Baek, Youngjin, et alARTICLE146 A Balanced Feedforward Current-Sense Current-Compensation Active EMI Filter for Common-Mode Noise Reduction
2019-03A Transformer-Isolated Common-Mode Active EMI Filter without Additional Components on Power LinesJeong, Sangyeong; Shin, Dongil; Kim, JingookARTICLE200 A Transformer-Isolated Common-Mode Active EMI Filter without Additional Components on Power Lines
2019-02Measurement and Analysis of Statistical IC Operation Errors in a Memory Module Due to System-Level ESD NoisePark, Myungjoon; Park, Junsik; Choi, Jongcheul, et alARTICLE245 Measurement and Analysis of Statistical IC Operation Errors in a Memory Module Due to System-Level ESD Noise
2019Accuracy investigation of equivalent dipole arrays for near-field estimation in presence of shielding or dielectric structuresKwak, Kyungjin; Bae, Tae-il; Hong, Kichul, et alARTICLE39 Accuracy investigation of equivalent dipole arrays for near-field estimation in presence of shielding or dielectric structures
2018-10Precise Analytical Model of Power Supply Induced Jitter Transfer Function at Inverter ChainsKim, Heegon; Kim, Jingook; Fan, Jun, et alARTICLE436 Precise Analytical Model of Power Supply Induced Jitter Transfer Function at Inverter Chains
2018-10A Cost-Effective Structure for Secondary Discharge Control to Improve System-Level ESD Immunity of a Mobile ProductPark, Junsik; Lee, Jongsung; Jo, Cheolgu, et alARTICLE140 A Cost-Effective Structure for Secondary Discharge Control to Improve System-Level ESD Immunity of a Mobile Product
2018-08Quantified Design Guidelines of a Compact Transformerless Active EMI Filter for Performance, Stability, and High Voltage ImmunityShin, Dongil; Jeong, Sangyeong; Kim, JingookARTICLE435 Quantified Design Guidelines of a Compact Transformerless Active EMI Filter for Performance, Stability, and High Voltage Immunity
2018-04Near-Field Validation of Dipole-Moment Model Extracted From GTEM Cell Measurements and Application to a Real Application ProcessorKwak, Kyungjin; Kim, Jaehyuk; Kim, JingookARTICLE523 Near-Field Validation of Dipole-Moment Model Extracted From GTEM Cell Measurements and Application to a Real Application Processor
2017-12Sensitivity Analysis of a Circuit Model for Power Distribution Network in a Multilayered Printed Circuit BoardShringarpure, Ketan; Pan, Siming; Kim, Jingook, et alARTICLE1976 Sensitivity Analysis of a Circuit Model for Power Distribution Network in a Multilayered Printed Circuit Board
2017-12IC Failure Analysis Due to Charged Board Events by Measurements and Modeling of Discharging Currents Through IC PinsPark, Junsik; Lee, Jongsung; Jo, Cheolgu, et alARTICLE431 IC Failure Analysis Due to Charged Board Events by Measurements and Modeling of Discharging Currents Through IC Pins
2017-10An Effective Experimental Optimization Method for Wireless Power Transfer System Design Using Frequency Domain MeasurementJeong, Sangyeong; Kim, Mina; Jung, Jee-Hoon, et alARTICLE518 An Effective Experimental Optimization Method for Wireless Power Transfer System Design Using Frequency Domain Measurement
2017-04Quantified Design Guides for the Reduction of Radiated Emissions in Package-Level Power Distribution NetworksShin, Dongil; Kim, Namsu; Lee, Jongjoo, et alARTICLE585 Quantified Design Guides for the Reduction of Radiated Emissions in Package-Level Power Distribution Networks
2017-01Fast and Accurate Calculation of System-Level ESD Noise Coupling to a Signal Trace by PEEC Model DecompositionPark, Junsik; Lee, Jongsung; Seol, Byongsu, et alARTICLE514 Fast and Accurate Calculation of System-Level ESD Noise Coupling to a Signal Trace by PEEC Model Decomposition
2017-01Statistical Analysis for Pattern-Dependent Simultaneous Switching Outputs (SSO) of Parallel Single-Ended BuffersKim, JingookARTICLE432 Statistical Analysis for Pattern-Dependent Simultaneous Switching Outputs (SSO) of Parallel Single-Ended Buffers
2016-12A slope and amplitude controllable triangular-current generator for the injection of a broad-band PDN noiseYoon, Changwook; Kim, Jingook; Kim, Sukjin, et alARTICLE389 A slope and amplitude controllable triangular-current generator for the injection of a broad-band PDN noise
2016-11High-frequency testing of vertical interconnection array using indirect contact probing method with an improved calibrationJeong, Jongwoo; Kim, Jingook; Kang, No-Weon, et alARTICLE565 High-frequency testing of vertical interconnection array using indirect contact probing method with an improved calibration

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