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Jeong, Hu Young (정후영)

Department
UNIST Central Research Facility(연구지원본부)
Website
http://ucrf.unist.ac.kr/
Lab
UCRF Electron Microscopy group (UCRF 전자현미경 그룹)
Research Keywords
Transmission Electron Microscopy, TEM, Interface analysis, Insitu analysis, Resistive switching memory, 2D TMD
Research Interests
Transmission electron microscopy (TEM) is vital for unveiling the crystal structure and chemical states of nanoscale materials such as 1 dimensional(D) nanowires, 2D thin layers, and 3D bulk materials. Our group at UCRT is performing active research about revealing fundamental nature of various nanomaterials using a spherical aberration corrected TEM,
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Issue DateTitleAuthor(s)TypeViewAltmetrics
2011-01Fabrication of TiO2 Memristive Arrays by Step and Flash Imprint LithographyYun, Dae Keun; Kim, Ki-Don; Jeong, Hu Young, et alARTICLE666 Fabrication of TiO2 Memristive Arrays by Step and Flash Imprint Lithography
2010-11Interface-Engineered Amorphous TiO2-Based Resistive Memory DevicesJeong, Hu Young; Lee, Jeong Yong; Choi, Sung-YoolARTICLE622 Interface-Engineered Amorphous TiO2-Based Resistive Memory Devices
2010-11Graphene Oxide Thin Films for Flexible Nonvolatile Memory ApplicationsJeong, Hu Young; Kim, Jong Yun; Kim, Jeong Won, et alARTICLE795 Graphene Oxide Thin Films for Flexible Nonvolatile Memory Applications
2010-07Direct observation of microscopic change induced by oxygen vacancy drift in amorphous TiO2 thin filmsJeong, Hu Young; Lee, Jeong Yong; Choi, Sung-YoolARTICLE954 Direct observation of microscopic change induced by oxygen vacancy drift in amorphous TiO2 thin films
2010-07Comprehensive modeling of resistive switching in the Al/TiOx/TiO2/Al heterostructure based on space-charge-limited conductionKim, Sungho; Jeong, Hu Young; Choi, Sung-Yool, et alARTICLE851 Comprehensive modeling of resistive switching in the Al/TiOx/TiO2/Al heterostructure based on space-charge-limited conduction
2010-06Conduction and Low-Frequency Noise Analysis in Al/alpha-TiOX/Al Bipolar Switching Resistance Random Access Memory DevicesLee, Jung-Kyu; Jeong, Hu Young; Cho, In-Tak, et alARTICLE638 Conduction and Low-Frequency Noise Analysis in Al/alpha-TiOX/Al Bipolar Switching Resistance Random Access Memory Devices
2010-05Flexible room-temperature NO2 gas sensors based on carbon nanotubes/reduced graphene hybrid filmsJeong, Hu Young; Lee, Dae-Sik; Choi, Hong Kyw, et alARTICLE1619 Flexible room-temperature NO2 gas sensors based on carbon nanotubes/reduced graphene hybrid films
2010-04Electrical current suppression in Pd-doped vanadium pentoxide nanowires caused by reduction in PdO due to hydrogen exposureKim, Byung Hoon; Oh, Soon-Young; Jeong, Hu Young, et alARTICLE688 Electrical current suppression in Pd-doped vanadium pentoxide nanowires caused by reduction in PdO due to hydrogen exposure
2010-03A low-temperature-grown TiO2-based device for the flexible stacked RRAM applicationJeong, Hu Young; Kim, Yong In; Lee, Jeong Yong, et alARTICLE855 A low-temperature-grown TiO2-based device for the flexible stacked RRAM application
2010-02Bipolar resistive switching in amorphous titanium oxide thin filmJeong, Hu Young; Lee, Jeong Yong; Ryu, Min-Ki, et alARTICLE645 Bipolar resistive switching in amorphous titanium oxide thin film
2010-01Bipolar resistive switching characteristics of poly(3,4-ethylene-dioxythiophene): Poly(styrenesulfonate) thin filmJeong, Hu Young; Kim, Jong Yun; Yoon, Tae Hyun, et alARTICLE599 Bipolar resistive switching characteristics of poly(3,4-ethylene-dioxythiophene): Poly(styrenesulfonate) thin film
2009-10Microscopic origin of bipolar resistive switching of nanoscale titanium oxide thin filmsJeong, Hu Young; Lee, Jeong Yong; Choi, Sung-Yool, et alARTICLE595 Microscopic origin of bipolar resistive switching of nanoscale titanium oxide thin films
2008Transparent ZnO-TFT Arrays fabricated by atomic layer depositionPark, Sang-Hee Ko; Hwang, Chi-Sun; Jeong, Hu Young, et alARTICLE824 Transparent ZnO-TFT Arrays fabricated by atomic layer deposition
2005-04Deformation behavior of bimodal nanostructured 5083 Al alloysHan, BQ; Lee, Zonghoon; Witkin, D, et alARTICLE778 Deformation behavior of bimodal nanostructured 5083 Al alloys

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