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정후영

Jeong, Hu Young
UCRF Electron Microscopy group
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dc.citation.number 11 -
dc.citation.startPage 11 -
dc.citation.title JAPANESE JOURNAL OF APPLIED PHYSICS -
dc.citation.volume 53 -
dc.contributor.author Shin, Jae Won -
dc.contributor.author Jeong, Hu Young -
dc.contributor.author Yoo, Seung Jo -
dc.contributor.author Lee, Seok-Hoon -
dc.contributor.author Han, Jun Hee -
dc.contributor.author Lee, Jeong Yong -
dc.contributor.author Ahn, Jun Sung -
dc.contributor.author Park, Chang Young -
dc.contributor.author Park, Kwang Wook -
dc.contributor.author Lee, Yong-Tak -
dc.contributor.author Kim, Jin-Gyu -
dc.contributor.author Kim, Tae Whan -
dc.date.accessioned 2023-12-22T02:07:10Z -
dc.date.available 2023-12-22T02:07:10Z -
dc.date.created 2014-12-03 -
dc.date.issued 2014-11 -
dc.description.abstract High-resolution transmission electron microscopy (HRTEM) images showed that the lattice distortion of as-grown InGaP/InGaAlP multiple quantum wells (MQWs) appeared to be due to the small thickness of the alloyed layers, and that their distortion was relaxed owing to the high atomic mobility. High-angle annular dark-field scanning transmission electron microscopy images demonstrated that the chemical intermixing of Ga and Al atoms between the InAlP and InGaP alloy layers due to thermal annealing relaxed the stress of the InGaAlP layer. The atomic arrangements of the as-grown and annealed MQWs are described on the basis of the experimental results. -
dc.identifier.bibliographicCitation JAPANESE JOURNAL OF APPLIED PHYSICS, v.53, no.11, pp.11 -
dc.identifier.doi 10.7567/JJAP.53.115201 -
dc.identifier.issn 0021-4922 -
dc.identifier.scopusid 2-s2.0-84909952954 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/9323 -
dc.identifier.wosid 000346462200039 -
dc.language 영어 -
dc.publisher JAPAN SOC APPLIED PHYSICS -
dc.title Atomic variations in digital alloy InGaP/InGaAlP multiple quantum wells due to thermal treatment -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Physics, Applied -
dc.relation.journalResearchArea Physics -
dc.description.journalRegisteredClass scie -

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