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- Kwak, Youngshin
- Color & Imaging Sciecne Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.endPage | 989 | - |
| dc.citation.startPage | 988 | - |
| dc.citation.title | International Symposium, Seminar, and Exhibition, Display Week 2025 | - |
| dc.contributor.author | An, Soonhyeng | - |
| dc.contributor.author | Kwak, Youngshin | - |
| dc.contributor.author | Ham, Junghyun | - |
| dc.contributor.author | Lee, Myung Young | - |
| dc.date.accessioned | 2026-01-09T15:50:24Z | - |
| dc.date.available | 2026-01-09T15:50:24Z | - |
| dc.date.created | 2026-01-09 | - |
| dc.date.issued | 2025-05-15 | - |
| dc.description.abstract | Brightness scales were obtained using Maximum Likelihood Difference Scaling method for the colors having higher or lower luminance than that of the reference white. Results showed that CIELAB L* effectively predicts perceived brightness for colors brighter than the background and the background luminance is the main factor affecting the brightness scale. | - |
| dc.identifier.bibliographicCitation | International Symposium, Seminar, and Exhibition, Display Week 2025, pp.988 - 989 | - |
| dc.identifier.doi | 10.1002/sdtp.18338 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/90181 | - |
| dc.language | 영어 | - |
| dc.publisher | John Wiley and Sons Inc | - |
| dc.title | Brightness Scales Above and Below Reference White via Maximum Likelihood Difference Scaling (MLDS) | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2025-05-12 | - |
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