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Jeong, Hu Young
UCRF Electron Microscopy group
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Microscopic origin of bipolar resistive switching of nanoscale titanium oxide thin films

Author(s)
Jeong, Hu YoungLee, Jeong YongChoi, Sung-YoolKim, Jeong Won
Issued Date
2009-10
DOI
10.1063/1.3251784
URI
https://scholarworks.unist.ac.kr/handle/201301/9013
Fulltext
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=70350378210
Citation
APPLIED PHYSICS LETTERS, v.95, no.16
Abstract
We report a direct observation of the microscopic origin of the bipolar resistive switching behavior in nanoscale titanium oxide films. Through a high-resolution transmission electron microscopy, an analytical transmission electron microscopy technique using energy-filtering transmission electron microscopy, and an in situ x-ray photoelectron spectroscopy, we demonstrated that the oxygen ions piled up at the top interface by an oxidation-reduction between the titanium oxide layer and the top Al metal electrode. We also found that the drift of oxygen ions during the on/off switching induced the bipolar resistive switching in the titanium oxide thin films.
Publisher
AMER INST PHYSICS
ISSN
0003-6951

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