File Download
There are no files associated with this item.
SFX Link
- Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
- Shin, Tae Joo
- Synchrotron Radiation Research Lab.
Views & Downloads
Detailed Information
Cited time in 
Cited time in 
Cited time in
Metadata Downloads
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferencePlace | 부산 | - |
| dc.citation.title | 2025 IEEE International Interconnect Technology Conference (IITC) | - |
| dc.contributor.author | Lee, Seunghun | - |
| dc.contributor.author | Shin, Tae Joo | - |
| dc.date.accessioned | 2026-01-07T14:26:42Z | - |
| dc.date.available | 2026-01-07T14:26:42Z | - |
| dc.date.created | 2026-01-07 | - |
| dc.date.issued | 2025-06-04 | - |
| dc.identifier.bibliographicCitation | 2025 IEEE International Interconnect Technology Conference (IITC) | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/89978 | - |
| dc.language | 영어 | - |
| dc.publisher | The Institute of Electrical and Electronics Engineers | - |
| dc.title | Exploration of residual strain in HfO2 thin films using the 2D-GIXD synchrotron technique | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2025-06-02 | - |
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.