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최은미

Choi, EunMi
THz Vacuum Electronics and Applied Electromagnetics Lab.
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dc.citation.title IEEE TRANSACTIONS ON ELECTRON DEVICES -
dc.contributor.author Lee, Junyeop -
dc.contributor.author Choi, Hong Eun -
dc.contributor.author Kim, Mincheal -
dc.contributor.author Bhotkar, Ketan -
dc.contributor.author Park, Kyu Chang -
dc.contributor.author Jeon, SeokGy -
dc.contributor.author Choi, EunMi -
dc.date.accessioned 2025-12-03T10:41:37Z -
dc.date.available 2025-12-03T10:41:37Z -
dc.date.created 2025-12-01 -
dc.date.issued 2025-11 -
dc.description.abstract Vertically aligned carbon nanotube (VACNT) arrays have been developed to enhance field emission (FE) performance. In this study, the CNT tips were arranged in a 17 x 17 square array, and various patterns were selectively introduced by removing the tips to mitigate the screening effect and improve the emission characteristics. FE experiments were conducted for each pattern and the corresponding simulations were performed and compared. To quantitatively evaluate the performance of each pattern, eight analytical models were introduced. Among these, the minimum E field (Min E) model predicted excellent agreement with the top three patterns in the experimental results, indicating potentially predictive tools for future emitter design. -
dc.identifier.bibliographicCitation IEEE TRANSACTIONS ON ELECTRON DEVICES -
dc.identifier.doi 10.1109/TED.2025.3625920 -
dc.identifier.issn 0018-9383 -
dc.identifier.scopusid 2-s2.0-105021518590 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/88825 -
dc.identifier.wosid 001616580300001 -
dc.language 영어 -
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC -
dc.title Physical Interpretation of Field Emission Behavior in Patterned Samples via Simulation-Validated Models -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic; Physics, Applied -
dc.relation.journalResearchArea Engineering; Physics -
dc.type.docType Article; Early Access -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Iron -
dc.subject.keywordAuthor Cathodes -
dc.subject.keywordAuthor Electric fields -
dc.subject.keywordAuthor Anodes -
dc.subject.keywordAuthor Voltage measurement -
dc.subject.keywordAuthor Analytical models -
dc.subject.keywordAuthor Fabrication -
dc.subject.keywordAuthor Current measurement -
dc.subject.keywordAuthor Carbon nanotubes -
dc.subject.keywordAuthor Tunneling -
dc.subject.keywordAuthor Carbon nanotubes (CNTs) -
dc.subject.keywordAuthor field emission (FE) -
dc.subject.keywordAuthor vacuum microelectronics -

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