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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | Kim, Junghwan | - |
| dc.contributor.author | Kim, Soohyun | - |
| dc.date.accessioned | 2025-09-29T11:30:36Z | - |
| dc.date.available | 2025-09-29T11:30:36Z | - |
| dc.date.issued | 2025-08 | - |
| dc.description.degree | Master | - |
| dc.description | Graduate School of Semiconductor Materials and Devices Engineering | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/88167 | - |
| dc.language | ENG | - |
| dc.publisher | Ulsan National Institute of Science and Technology | - |
| dc.rights.embargoReleaseDate | 9999-12-31 | - |
| dc.rights.embargoReleaseTerms | 9999-12-31 | - |
| dc.subject | Oxide, Thin film transistors, IGZO, Field-Effect Mobility | - |
| dc.title | Mobility Overestimation in Thin-Film Transistors: Effects of Device Geometry | - |
| dc.type | Thesis | - |
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