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- Baek, Seungryul
- UNIST VISION AND LEARNING LAB.
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.assignee | 울산과학기술원 | - |
| dc.contributor.author | 구윤회 | - |
| dc.contributor.author | 백승렬 | - |
| dc.date.accessioned | 2025-09-12T16:30:37Z | - |
| dc.date.application | 2022-10-19 | - |
| dc.date.available | 2025-09-12T16:30:37Z | - |
| dc.date.registration | 2025-09-02 | - |
| dc.identifier.patentApplicationNumber | 10-2022-0134935 | - |
| dc.identifier.patentRegistrationNumber | 10-2855975 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/87977 | - |
| dc.title | 페이크 이미지 검출을 위한 특징 추출 방법 및 그 시스템 | - |
| dc.type | Patent | - |
| dc.publisher.country | KO | - |
| dc.type.iprs | 특허 | - |
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