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Lee, Jimin
Radiation & Medical Intelligence Lab.
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dc.citation.startPage 110682 -
dc.citation.title COMPUTERS IN BIOLOGY AND MEDICINE -
dc.citation.volume 196 -
dc.contributor.author Cho, Hyungjoo -
dc.contributor.author Lee, Jimin -
dc.contributor.author Ryu, Dongmin -
dc.contributor.author Ki, Juhyeong -
dc.contributor.author Ye, Sung-Joon -
dc.date.accessioned 2025-08-11T13:30:00Z -
dc.date.available 2025-08-11T13:30:00Z -
dc.date.created 2025-08-11 -
dc.date.issued 2025-09 -
dc.description.abstract Optical Diffraction Tomography (ODT) is a promising technique for three-dimensional imaging, but practical use demands rigorous robustness testing due to real-world noise factors. Despite the growing importance of machine learning safety, robustness in ODT remains underexplored. We propose the first comprehensive robustness testing protocol for ODT-based classifiers by simulating 16 corruption scenarios to create a corrupted dataset. To enhance robustness and accuracy, we introduce CutPix, a data augmentation strategy that balances shape and texture information through fractal pattern mixing and a cut-and-concatenate approach. Our experiments show that CutPix significantly improves robustness under various corrupted environments compared to existing techniques, particularly against pattern noises. All code and corruption simulation scripts are publicly available at https://github.com/NySunShine/odt-robustness-evaluation -
dc.identifier.bibliographicCitation COMPUTERS IN BIOLOGY AND MEDICINE, v.196, pp.110682 -
dc.identifier.doi 10.1016/j.compbiomed.2025.110682 -
dc.identifier.issn 0010-4825 -
dc.identifier.scopusid 2-s2.0-105010317771 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/87701 -
dc.language 영어 -
dc.publisher PERGAMON-ELSEVIER SCIENCE LTD -
dc.title Robustness evaluation against corruptions for Optical Diffraction Tomography-based classifiers -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Data augmentation -
dc.subject.keywordAuthor Image classification -
dc.subject.keywordAuthor Optical Diffraction Tomography -
dc.subject.keywordAuthor Robustness evaluation -

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