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김주영

Kim, Ju-Young
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dc.citation.endPage 45285 -
dc.citation.number 30 -
dc.citation.startPage 45268 -
dc.citation.title ACS APPLIED MATERIALS & INTERFACES -
dc.citation.volume 17 -
dc.contributor.author Jeon, Hansol -
dc.contributor.author Yoo, Hyeonji -
dc.contributor.author Lee, So-Hyeon -
dc.contributor.author Sim, Youngju -
dc.contributor.author Kim, Su-Min -
dc.contributor.author Kwak, Ji-Youn -
dc.contributor.author Kim, Younghoon -
dc.contributor.author Kim, Dong-Hyeon -
dc.contributor.author Jo, Ji-Hyeon -
dc.contributor.author Jeon, Jiheon -
dc.contributor.author Hwang, Gyeong-Seok -
dc.contributor.author Kim, Ju-Young -
dc.date.accessioned 2025-08-05T10:30:05Z -
dc.date.available 2025-08-05T10:30:05Z -
dc.date.created 2025-08-04 -
dc.date.issued 2025-07 -
dc.description.abstract The demand for deformable optoelectronic devices that are bendable, stretchable, and foldable has significantly increased. Accordingly, recent research has focused on ensuring the flexibility and stretchability of devices under various deformation modes, making the evaluation and enhancement of the mechanical reliability crucial. Here, we review strategies to improve the flexibility and stretchability of deformable optoelectronic devices, including intrinsic approaches to increasing the elastic deformation limit of materials and extrinsic structural design strategies at the device level. We introduce recent advances in the mechanical reliability of these devices in different deformation modes. Furthermore, we discuss mechanical testing methods for enhancing mechanical reliability, including conventional bulk-scale mechanical testing, nanomechanical tests for constituent thin-layer materials, and computational simulation tools for analysis and prediction. -
dc.identifier.bibliographicCitation ACS APPLIED MATERIALS & INTERFACES, v.17, no.30, pp.45268 - 45285 -
dc.identifier.doi 10.1021/acsami.5c10681 -
dc.identifier.issn 1944-8244 -
dc.identifier.scopusid 2-s2.0-105012785907 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/87647 -
dc.identifier.wosid 001531624300001 -
dc.language 영어 -
dc.publisher AMER CHEMICAL SOC -
dc.title Nanomechanical Insights into Enhancing Flexibility and Reliability in Deformable Optoelectronic Devices -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Nanoscience & Nanotechnology; Materials Science, Multidisciplinary -
dc.relation.journalResearchArea Science & Technology - Other Topics; Materials Science -
dc.type.docType Review; Early Access -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor nanomechanics -
dc.subject.keywordAuthor deformable optoelectronic device -
dc.subject.keywordAuthor flexibility -
dc.subject.keywordAuthor deformability -
dc.subject.keywordAuthor reliability -
dc.subject.keywordPlus ELASTIC-MODULUS -
dc.subject.keywordPlus POLYMER -
dc.subject.keywordPlus FILMS -
dc.subject.keywordPlus GRAPHENE -
dc.subject.keywordPlus MICROSTRUCTURES -
dc.subject.keywordPlus INDENTATION -
dc.subject.keywordPlus FABRICATION -
dc.subject.keywordPlus CONDUCTORS -
dc.subject.keywordPlus TRANSPARENT ELECTRODE -
dc.subject.keywordPlus HIGH-CONDUCTIVITY -

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