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Kim, Kyung Rok
Nano-Electronic Emerging Devices Lab.
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dc.citation.endPage 606 -
dc.citation.startPage 599 -
dc.citation.title IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY -
dc.citation.volume 13 -
dc.contributor.author Choi, Young-Eun -
dc.contributor.author Kim, Woo-Seok -
dc.contributor.author Kim, Myoung -
dc.contributor.author Park, Junyoung -
dc.contributor.author Ryu, MinWoo -
dc.contributor.author Kim, Kyung Rok -
dc.date.accessioned 2025-07-18T17:30:00Z -
dc.date.available 2025-07-18T17:30:00Z -
dc.date.created 2025-07-18 -
dc.date.issued 2025-07 -
dc.description.abstract In this work, we present a tunneling based ternary CMOS (T-CMOS) compact model for low power ternary-SRAM (T-SRAM) design using CMOS technology. By designing compact model parameters of band-to-band tunneling current (IBTBT) according to effective doping concentration of T-CMOS, more accurate current model has been obtained in comparison with the conventional IBTBT models. In addition, parasitic capacitance models are obtained for transient operation. Comparing model and experimental data, it enables the prediction of T-CMOS performance under various VDD conditions. The model is validated to be more suitable for T-CMOS with low power on-chip memory applications. -
dc.identifier.bibliographicCitation IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, v.13, pp.599 - 606 -
dc.identifier.doi 10.1109/JEDS.2025.3588398 -
dc.identifier.issn 2168-6734 -
dc.identifier.scopusid 2-s2.0-105012459633 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/87468 -
dc.identifier.wosid 001544223100007 -
dc.language 영어 -
dc.publisher IEEE -
dc.title Ternary CMOS Compact Model for Low Power On-Chip Memory Applications -
dc.type Article -
dc.description.isOpenAccess TRUE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic -
dc.relation.journalResearchArea Engineering -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Semiconductor process modeling -
dc.subject.keywordPlus AVALANCHE BREAKDOWN -

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