There are no files associated with this item.
Cited time in
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.citation.endPage | 606 | - |
| dc.citation.startPage | 599 | - |
| dc.citation.title | IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY | - |
| dc.citation.volume | 13 | - |
| dc.contributor.author | Choi, Young-Eun | - |
| dc.contributor.author | Kim, Woo-Seok | - |
| dc.contributor.author | Kim, Myoung | - |
| dc.contributor.author | Park, Junyoung | - |
| dc.contributor.author | Ryu, MinWoo | - |
| dc.contributor.author | Kim, Kyung Rok | - |
| dc.date.accessioned | 2025-07-18T17:30:00Z | - |
| dc.date.available | 2025-07-18T17:30:00Z | - |
| dc.date.created | 2025-07-18 | - |
| dc.date.issued | 2025-07 | - |
| dc.description.abstract | In this work, we present a tunneling based ternary CMOS (T-CMOS) compact model for low power ternary-SRAM (T-SRAM) design using CMOS technology. By designing compact model parameters of band-to-band tunneling current (IBTBT) according to effective doping concentration of T-CMOS, more accurate current model has been obtained in comparison with the conventional IBTBT models. In addition, parasitic capacitance models are obtained for transient operation. Comparing model and experimental data, it enables the prediction of T-CMOS performance under various VDD conditions. The model is validated to be more suitable for T-CMOS with low power on-chip memory applications. | - |
| dc.identifier.bibliographicCitation | IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, v.13, pp.599 - 606 | - |
| dc.identifier.doi | 10.1109/JEDS.2025.3588398 | - |
| dc.identifier.issn | 2168-6734 | - |
| dc.identifier.scopusid | 2-s2.0-105012459633 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/87468 | - |
| dc.identifier.wosid | 001544223100007 | - |
| dc.language | 영어 | - |
| dc.publisher | IEEE | - |
| dc.title | Ternary CMOS Compact Model for Low Power On-Chip Memory Applications | - |
| dc.type | Article | - |
| dc.description.isOpenAccess | TRUE | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.type.docType | Article | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.subject.keywordAuthor | Semiconductor process modeling | - |
| dc.subject.keywordPlus | AVALANCHE BREAKDOWN | - |
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Tel : 052-217-1403 / Email : scholarworks@unist.ac.kr
Copyright (c) 2023 by UNIST LIBRARY. All rights reserved.
ScholarWorks@UNIST was established as an OAK Project for the National Library of Korea.