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Yoon, Heein
Advanced Circuits and Electronics Lab.
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dc.citation.endPage 31446 -
dc.citation.number 16 -
dc.citation.startPage 31435 -
dc.citation.title IEEE SENSORS JOURNAL -
dc.citation.volume 25 -
dc.contributor.author Kim, Yonggi -
dc.contributor.author Cho, Jeonghoon -
dc.contributor.author Pyeon, You Jang -
dc.contributor.author Kim, Hyunjoong -
dc.contributor.author Lee, Sangmoon -
dc.contributor.author Kwak, Jong-Hyun -
dc.contributor.author Yoon, Heein -
dc.contributor.author Lee, Yun-Sik -
dc.contributor.author Shin, Heungjoo -
dc.contributor.author Kim, Jae Joon -
dc.date.accessioned 2025-07-14T12:00:01Z -
dc.date.available 2025-07-14T12:00:01Z -
dc.date.created 2025-07-14 -
dc.date.issued 2025-08 -
dc.description.abstract This paper presents a mixture-gas detectable edgecomputing device with two step on-sensor classification and regression capabilities. Mixture-gas classification is achieved through a proposed analog on-chip AI circuit, and an analog auto-normalization circuit for better AI accuracy is integrated together in the readout integrated circuit (ROIC). For on-edge mixture-gas concentration analysis, a proposed cross-iterative tuning (CIT) regression algorithm is embedded in the edge device. For system-level feasibility, an edge-computing IoT device prototype with metal-oxide-semiconductor (MOS) sensor devices is manufactured based on the ROIC and experimentally verified to achieve 25.9% better classification and 10.9% better regression. -
dc.identifier.bibliographicCitation IEEE SENSORS JOURNAL, v.25, no.16, pp.31435 - 31446 -
dc.identifier.doi 10.1109/JSEN.2025.3586060 -
dc.identifier.issn 1530-437X -
dc.identifier.scopusid 2-s2.0-105010640862 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/87430 -
dc.identifier.wosid 001551575900016 -
dc.language 영어 -
dc.publisher Institute of Electrical and Electronics Engineers -
dc.title A Mixture-Gas Multisensor Interface with On-Chip Classification and On-Edge Regression -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & ElectronicInstruments & InstrumentationPhysics, Applied -
dc.relation.journalResearchArea EngineeringInstruments & InstrumentationPhysics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Cross-iterative tuning (CIT) regression neural networkedge computingmetal-oxide-semiconductor (MOS)metal-oxide-semiconductor (MOS)mixture-gas sensoron-chip artificial intelligence (AI)on-chip artificial intelligence (AI)readout integrated circuit (ROIC)readout integrated circuit (ROIC)readout integrated circuit (ROIC) -
dc.subject.keywordPlus AIR -

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