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권오훈

Kwon, Oh Hoon
Ultrafast Laser Spectroscopy and Nano-microscopy Lab.
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DC Field Value Language
dc.citation.endPage 22 -
dc.citation.number 5 -
dc.citation.startPage 1 -
dc.citation.title NEW JOURNAL OF PHYSICS -
dc.citation.volume 14 -
dc.contributor.author Park, Sang Tae -
dc.contributor.author Kwon, Oh Hoon -
dc.contributor.author Zewail, Ahmed H. -
dc.date.accessioned 2023-12-22T05:09:35Z -
dc.date.available 2023-12-22T05:09:35Z -
dc.date.created 2014-11-12 -
dc.date.issued 2012-05 -
dc.description.abstract The energy and time correlation, i.e. the chirp, of imaging electron pulses in dispersive propagation is measured by time-slicing (temporal hole burning) using photon-induced near-field electron microscopy. The chirp coefficient and the degree of correlation are obtained in addition to the duration of the electron pulse and its energy spread. Improving temporal and energy resolutions by time-slicing and energy-selection is discussed here and we explore their utility in imaging with time and energy resolutions below those of the generated ultrashort electron pulse. Potential applications for these imaging capabilities are discussed. -
dc.identifier.bibliographicCitation NEW JOURNAL OF PHYSICS, v.14, no.5, pp.1 - 22 -
dc.identifier.doi 10.1088/1367-2630/14/5/053046 -
dc.identifier.issn 1367-2630 -
dc.identifier.scopusid 2-s2.0-84861935769 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/8726 -
dc.identifier.url http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84861935769 -
dc.identifier.wosid 000304879700002 -
dc.language 영어 -
dc.publisher IOP PUBLISHING LTD -
dc.title Chirped imaging pulses in four-dimensional electron microscopy: femtosecond pulsed hole burning -
dc.type Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordPlus ENERGY RESOLUTION -
dc.subject.keywordPlus DIFFRACTION -
dc.subject.keywordPlus ATTOSECOND -
dc.subject.keywordPlus DYNAMICS -
dc.subject.keywordPlus LENSES -
dc.subject.keywordPlus GUN -

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